Test & Measurement


Burn-in testing environments push switching components to their limits, demanding signal integrity, high-voltage isolation, and long-term reliability across thousands of channels. Even minor issues like contact resistance drift, thermal EMF, or parasitic effects can derail precision measurements and compromise data integrity.
In this whitepaper we dive into how reed relays tackle these pain points head-on:
Read the full application note to learn how to optimize your switching architecture.
Download the Whitepaper