Application

Reliable Multi-GHz and High-Speed Digital Signal Switching in Semiconductor Test Systems

System‑on‑Chip (SoC) testers are being pushed harder than ever, handling DC parametric measurements, high‑speed digital interfaces, and multi‑GHz RF signals, all within increasingly compact and high‑density test architectures.
As signal speeds rise and tolerances shrink, signal switching performance has become a critical factor in measurement accuracy, test coverage, and throughput.

Our latest application note explores how RF‑capable reed relays play a key role in enabling reliable and repeatable switching in advanced semiconductor test systems. 

• Signal switching requirements in modern SoC testers and ATE
• Electrical considerations for multi‑GHz RF and high‑speed digital signal routing
• The effect of parasitics on insertion loss, reflections, and crosstalk
• Common SoC tester switching functions where RF reed relays are used
• How RF reed relays compare to alternative switching technologies

Read the full application note to learn how to optimize your switching architecture.